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Search for "force measurement" in Full Text gives 21 result(s) in Beilstein Journal of Nanotechnology.

Laser-processed antiadhesive bionic combs for handling nanofibers inspired by nanostructures on the legs of cribellate spiders

  • Sebastian Lifka,
  • Kristóf Harsányi,
  • Erich Baumgartner,
  • Lukas Pichler,
  • Dariya Baiko,
  • Karsten Wasmuth,
  • Johannes Heitz,
  • Marco Meyer,
  • Anna-Christin Joel,
  • Jörn Bonse and
  • Werner Baumgartner

Beilstein J. Nanotechnol. 2022, 13, 1268–1283, doi:10.3762/bjnano.13.105

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  • Figure S1 in Supporting Information File 1. In Figure 7, the peel-off force measurement is exemplified for the polished (Figure 7a) and LIPSS-covered (Figure 7b) steel samples. The applied weights and, hence, the normal forces are equal in Figure 7a and Figure 7b. The cone diameter d of the nanofiber
  • of the LIPSS, is only 170 nm and, therefore, too low to reach the antiadhesive state according to the above theory (2a > 250 nm). This explains why the peel-off force measurement did not show a significant difference for the polished control and the LIPSS-covered Al alloy sample. Instead, the mean
  • too low. Scanning electron micrograph of electrospun nanofibers. One can see the random orientation of the individual fibers forming a kind of mesh. Peel-off force measurement of polished (a) and LIPSS-covered (b) steel samples. The applied weights and hence the normal forces are equal in panels (a
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Published 07 Nov 2022

Quantitative dynamic force microscopy with inclined tip oscillation

  • Philipp Rahe,
  • Daniel Heile,
  • Reinhard Olbrich and
  • Michael Reichling

Beilstein J. Nanotechnol. 2022, 13, 610–619, doi:10.3762/bjnano.13.53

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  • measuring a heterogeneous atomic surface. We propose to measure the AFM observables along a path parallel to the oscillation direction in order to reliably recover the force along this direction. Keywords: atomic force microscopy; cantilever; quantitative force measurement; sampling path; Introduction
  • , while the tip–surface distance zts is measured along the z-axis. In most AFM implementations, the force measurement is restricted to nominally measuring the normal component of the tip–sample force often denoted by FN. The ideal force curve is a measurement of while the measurement of is referred to
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Published 06 Jul 2022

Pull-off and friction forces of micropatterned elastomers on soft substrates: the effects of pattern length scale and stiffness

  • Peter van Assenbergh,
  • Marike Fokker,
  • Julian Langowski,
  • Jan van Esch,
  • Marleen Kamperman and
  • Dimitra Dodou

Beilstein J. Nanotechnol. 2019, 10, 79–94, doi:10.3762/bjnano.10.8

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Published 08 Jan 2019

A comparison of tarsal morphology and traction force in the two burying beetles Nicrophorus nepalensis and Nicrophorus vespilloides (Coleoptera, Silphidae)

  • Liesa Schnee,
  • Benjamin Sampalla,
  • Josef K. Müller and
  • Oliver Betz

Beilstein J. Nanotechnol. 2019, 10, 47–61, doi:10.3762/bjnano.10.5

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  • between the three different roughnesses (for example, see dotted line). The measured static contact angles of water (arithmetic mean ± s.d, n = 10) are presented below; different letters indicate statistical differences of p < 0.05). (b) Exemplary force-vs-time curve for a traction-force measurement of N
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Published 04 Jan 2019

Investigation of CVD graphene as-grown on Cu foil using simultaneous scanning tunneling/atomic force microscopy

  • Majid Fazeli Jadidi,
  • Umut Kamber,
  • Oğuzhan Gürlü and
  • H. Özgür Özer

Beilstein J. Nanotechnol. 2018, 9, 2953–2959, doi:10.3762/bjnano.9.274

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  • in constant-current mode and the force image acquired in backward scan in constant-height mode are shown. The force measurement shows the honeycomb pattern in the entire image with some local distortions throughout the image. On the other hand, the STM topography exhibits a triangular pattern with a
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Published 28 Nov 2018

When the going gets rough – studying the effect of surface roughness on the adhesive abilities of tree frogs

  • Niall Crawford,
  • Thomas Endlein,
  • Jonathan T. Pham,
  • Mathis Riehle and
  • W. Jon P. Barnes

Beilstein J. Nanotechnol. 2016, 7, 2116–2131, doi:10.3762/bjnano.7.201

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Published 30 Dec 2016

Influence of ambient humidity on the attachment ability of ladybird beetles (Coccinella septempunctata)

  • Lars Heepe,
  • Jonas O. Wolff and
  • Stanislav N. Gorb

Beilstein J. Nanotechnol. 2016, 7, 1322–1329, doi:10.3762/bjnano.7.123

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  • not only dry adhesive setae are affected by ambient humidity, but also setae that stick due to the capillarity of an oily secretion. Keywords: adhesion; beetle; biomechanics; force measurement; friction; insect; locomotion; surface; Introduction Substrate attachment plays an important role in the
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Published 22 Sep 2016

Development of a novel nanoindentation technique by utilizing a dual-probe AFM system

  • Eyup Cinar,
  • Ferat Sahin and
  • Dalia Yablon

Beilstein J. Nanotechnol. 2015, 6, 2015–2027, doi:10.3762/bjnano.6.205

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  • integration of higher resolution depth and force measurement techniques for nanoindentation tools. Although this helped in increasing the accuracy of the experimental data, the current research demonstrates that there are still limitations on the commercially available tools and various problems still need to
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Published 12 Oct 2015

Probing fibronectin–antibody interactions using AFM force spectroscopy and lateral force microscopy

  • Andrzej J. Kulik,
  • Małgorzata Lekka,
  • Kyumin Lee,
  • Grazyna Pyka-Fościak and
  • Wieslaw Nowak

Beilstein J. Nanotechnol. 2015, 6, 1164–1175, doi:10.3762/bjnano.6.118

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  • surface (for type C cantilevers, the normal PSD sensitivity was 22.1 ± 3.5 nm/V). Analogous to the normal force measurement, the lateral force (inferred from the torsion of the cantilever) was determined by multiplying the recorded signal (measured in V) by the torsional spring constant and lateral
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Published 15 May 2015

Dynamic calibration of higher eigenmode parameters of a cantilever in atomic force microscopy by using tip–surface interactions

  • Stanislav S. Borysov,
  • Daniel Forchheimer and
  • David B. Haviland

Beilstein J. Nanotechnol. 2014, 5, 1899–1904, doi:10.3762/bjnano.5.200

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  • force reconstruction technique and does not require any prior knowledge of the eigenmode shape or the particular form of the tip–surface interaction. The calibration method proposed requires a single-point force measurement by using a multimodal drive and its accuracy is independent of the unknown
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Published 29 Oct 2014

From sticky to slippery: Biological and biologically-inspired adhesion and friction

  • Stanislav N. Gorb and
  • Kerstin Koch

Beilstein J. Nanotechnol. 2014, 5, 1450–1451, doi:10.3762/bjnano.5.157

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  • . Modern experimental approaches combine a variety of microscopy methods, such as light microscopy, white-light interferometry, TEM, SEM, cryo-SEM, and AFM, with force measurement techniques at the macro-, micro- and especially at the nanoscale. This Thematic Series is a collection of experimental and
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Published 03 Sep 2014

The study of surface wetting, nanobubbles and boundary slip with an applied voltage: A review

  • Yunlu Pan,
  • Bharat Bhushan and
  • Xuezeng Zhao

Beilstein J. Nanotechnol. 2014, 5, 1042–1065, doi:10.3762/bjnano.5.117

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Published 15 Jul 2014

Calibration of quartz tuning fork spring constants for non-contact atomic force microscopy: direct mechanical measurements and simulations

  • Jens Falter,
  • Marvin Stiefermann,
  • Gernot Langewisch,
  • Philipp Schurig,
  • Hendrik Hölscher,
  • Harald Fuchs and
  • André Schirmeisen

Beilstein J. Nanotechnol. 2014, 5, 507–516, doi:10.3762/bjnano.5.59

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  • ” sensors. The stiffness of the force sensor is necessary for the transformation of the experimental frequency shift data, Δf, to forces. Consequently, a force measurement can only be as precise as the determination of each factor in the equation that links the frequency shift to the tip–sample forces [8
  • to the scale is then calculated by multiplying the weight with the gravitation constant g = 9.81 m/s2 resulting in an accuracy of the force measurement of 9.81 μN. The stiffness of the sensor can now be measured by pushing the sensor onto the scale with the micrometer screw while simultaneously
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Published 23 Apr 2014

Energy dissipation in multifrequency atomic force microscopy

  • Valentina Pukhova,
  • Francesco Banfi and
  • Gabriele Ferrini

Beilstein J. Nanotechnol. 2014, 5, 494–500, doi:10.3762/bjnano.5.57

Graphical Abstract
  • measured at room temperature [12]. The cantilever approaches the graphite surface at constant velocity of 0.817 nm/ms. The inverse optical lever sensitivity (InvOLS) [13] has been measured as the inverse slope of the linear contact part of a standard force measurement [14] that was made on the graphite
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Published 17 Apr 2014

Exploring the complex mechanical properties of xanthan scaffolds by AFM-based force spectroscopy

  • Hao Liang,
  • Guanghong Zeng,
  • Yinli Li,
  • Shuai Zhang,
  • Huiling Zhao,
  • Lijun Guo,
  • Bo Liu and
  • Mingdong Dong

Beilstein J. Nanotechnol. 2014, 5, 365–373, doi:10.3762/bjnano.5.42

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  • : Mechanical measurements of the xanthan scaffolds were performed by force measurement at a loading rate of 1 µm/s. The FS experiments were performed in isopropanol as buffer [5] in neutral environment with the diluted solution. The measurement started with the tip approaching the sample surface until a
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Published 27 Mar 2014

Polynomial force approximations and multifrequency atomic force microscopy

  • Daniel Platz,
  • Daniel Forchheimer,
  • Erik A. Tholén and
  • David B. Haviland

Beilstein J. Nanotechnol. 2013, 4, 352–360, doi:10.3762/bjnano.4.41

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  • understanding of the forces between the tip and the surface. We showed that polynomial force reconstruction is an intuitive and powerful method to approximate this interaction, and we demonstrated the method’s use for accurate and detailed force measurement and for high-resolution surface-parameter mapping with
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Published 10 Jun 2013

Towards 4-dimensional atomic force spectroscopy using the spectral inversion method

  • Jeffrey C. Williams and
  • Santiago D. Solares

Beilstein J. Nanotechnol. 2013, 4, 87–93, doi:10.3762/bjnano.4.10

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  • interaction as a corrugated plane instead of a single force curve. An example is provided in Figure 2. We point out that although the proposed expanded method provides data in four dimensions, it is not an unrestricted 4D force-measurement method. This is because the velocity cannot be varied arbitrarily, but
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Published 07 Feb 2013

Characterization of the mechanical properties of qPlus sensors

  • Jan Berger,
  • Martin Švec,
  • Martin Müller,
  • Martin Ledinský,
  • Antonín Fejfar,
  • Pavel Jelínek and
  • Zsolt Majzik

Beilstein J. Nanotechnol. 2013, 4, 1–9, doi:10.3762/bjnano.4.1

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  • distance, and z being the closest tip approach towards the sample. From Equation 8 it is clear, that an error in the stiffness leads to a proportional but systematic error in the force measurement. In the large amplitude limit, there is a second dominant source of errors in quantitative force analyses
  • , namely the amplitude calibration (see Equation 8). The other two methods do not depend on the amplitude calibration. They depend only on size measurements, which can be calibrated with very high accuracy by using optical or electron microscopes. Therefore, we suppose that the overall error in the force
  • measurement is smaller with these methods. Especially with the added-mass method because this can take into account other influences on the stiffness such as improper gluing during sensor construction [22]. We have to note here that in the case of our home-built sensors neither the gluing nor the length of
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Published 02 Jan 2013

Growth behaviour and mechanical properties of PLL/HA multilayer films studied by AFM

  • Cagri Üzüm,
  • Johannes Hellwig,
  • Narayanan Madaboosi,
  • Dmitry Volodkin and
  • Regine von Klitzing

Beilstein J. Nanotechnol. 2012, 3, 778–788, doi:10.3762/bjnano.3.87

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  • , introduced in the experimental section. The total penetration depth in a force measurement has already been used to determine the thickness of nanometre-scale coatings, e.g., lipid bilayers [29], but, to our knowledge, the total thickness of micron-scale polymeric films has not yet been extracted in this way
  • to obtain an average thickness. The three regions on the scratch were selected so that the distance between them was around 2 mm. Full-indentation method An AFM force measurement setup was used for indentation in the z-direction. The optical lever sensitivity was determined on a hard surface before
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Published 21 Nov 2012

Assessing the plasmonics of gold nano-triangles with higher order laser modes

  • Laura E. Hennemann,
  • Andreas Kolloch,
  • Andreas Kern,
  • Josip Mihaljevic,
  • Johannes Boneberg,
  • Paul Leiderer,
  • Alfred J. Meixner and
  • Dai Zhang

Beilstein J. Nanotechnol. 2012, 3, 674–683, doi:10.3762/bjnano.3.77

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  • patterns of gold nano-triangles on glass excited by an azimuthally polarised laser beam. In (a) and (b) h = 40 nm, whereas in (c) h = 50 nm. The blue image was performed on the same sample as (c) and is an overlay of a topographical shear-force measurement (shown in blue) and a subsequent confocal optical
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Published 04 Oct 2012

Impact of cell shape in hierarchically structured plant surfaces on the attachment of male Colorado potato beetles (Leptinotarsa decemlineata)

  • Bettina Prüm,
  • Robin Seidel,
  • Holger Florian Bohn and
  • Thomas Speck

Beilstein J. Nanotechnol. 2012, 3, 57–64, doi:10.3762/bjnano.3.7

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  • Botanical Garden of the University of Freiburg for cultivating the plants investigated, and the engineers and technicians of the Technical Workshop of the Institute for Biology II/III for the construction of the traction-force measurement device. We also thank Dr Randall Cassada for correcting the English
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Published 23 Jan 2012
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